Webinar by networkpartner SIOS: How to measure the invisible with the most accurate SIOS measurement systems

|   Nano Termine

30. September 2021, 08:30 and 15:30 Uhr CET

Our Nanoanalytics networkpartner SIOS Meßtechnik GmbH invites you to its webinar:

How to measure the invisible with the most accurate SIOS measurement systems.

Today's technological developments follow a common trend in many manufacturing industries: Products are becoming more complex and powerful, the demands on manufacturing quality are constantly increasing, while components and object structures are becoming smaller and more compact. In turn, the increasing industrial use of micro- and nanotechnological objects leads to ever higher demands on the measurement technology used in manufacturing, verification and positioning. The tasks are realized on objects that are getting larger and larger, so that a link between the macro- and nano-worlds has to be made.

Nanometrology is not only of great interest to the research or semiconductor industry, as a driver of the trend, it has long since found its way into areas such as nanoelectronics, microoptics, genetic engineering, molecular biology, materials research and many more.

In the approximately 45-minute webinar, you will learn how to measure the invisible with the most accurate measurement systems available from SIOS.

The experts Dr. Denis Dontsov and Enrico Langlotz will provide information on the following main topics:

- ultra-stable high-resolution laser interferometers

- the basics of nanopositioning

- application of nanopositioning and nanomeasuring machine

The speakers will be very happy to answer your questions about nanometrology after the presentation.

Find more information on this webinar here.

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